Accession Number : ADA289803

Title :   Experimental Methods in Residual Stress Measurement Using a Position-Sensitive Single-Exposure Scintillation Detection System.

Descriptive Note : Final rept.,

Corporate Author : ARMY ARMAMENT RESEARCH DEVELOPMENT AND ENGINEERING CENTER WATERVLIET NY BENET LABS

Personal Author(s) : Lee, S. L. ; Doxbeck, M. ; Capsimalis, G. P.

PDF Url : ADA289803

Report Date : SEP 1994

Pagination or Media Count : 33

Abstract : In the Denver D-1000-A single-exposure position-sensitive scintillation detection (PSSD) system, surface residual stress measurement in any chosen direction is based on crystalline plane spacings determined in two directions normal to the surface made simultaneously in a single psi tilt. This technical allows fast, noncontacting, and nondestructive biaxial stress analysis. In this report, system performance is characterized by studying the noise, gain, and diffraction peak profiles as a function of diode array element. A four-point bend experiment was performed to determine the elastic constant of the 211 plane of body-centered cubic martensitic steel. Residual stress measurements were performed in several steel specimens and compared to measurements made on a similar system at Pennsylvania State University. Local software development allowed the single-exposure PSSD to run in a multiple-exposure mode for improved accuracy in biaxial stress analysis. (MM)

Descriptors :   *NONDESTRUCTIVE TESTING, *STRESS ANALYSIS, *X RAY DIFFRACTION, *STEEL, STRESS STRAIN RELATIONS, COMPUTER PROGRAMS, DIODES, FIBER OPTICS, PEAK VALUES, STIFFNESS, ELASTIC PROPERTIES, MODULUS OF ELASTICITY, CURRENT DENSITY, X RAYS, STRENGTH(MECHANICS), CRACK PROPAGATION, DIFFRACTION, RESIDUAL STRESS, GAIN, FATIGUE(MECHANICS), BIAXIAL STRESSES, PIXELS, PLASTIC FLOW, POISSON RATIO, SCINTILLATION COUNTERS, X RAY TUBES, ELECTROLYTIC POLISHING.

Subject Categories : Metallurgy and Metallography
      Nuclear Physics & Elementary Particle Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE