Accession Number : ADA289806
Title : Thin-Film Resistor Array Characterization.
Descriptive Note : Final rept. Jan-Jun 94,
Corporate Author : ARMY MISSILE COMMAND REDSTONE ARSENAL AL SYSTEMS SIMULATION AND DEVELOPMENT DIRECTORATE
Personal Author(s) : Sanderford, Vicki ; Mobley, Scott
PDF Url : ADA289806
Report Date : DEC 1994
Pagination or Media Count : 72
Abstract : This paper provides the results of thin-film resistor array testing which was recently performed at the System Simulation and Development Directorate (SS&DD), Research, Development, and Engineering Center (RDEC). The objective of these tests was to determine the suitability of the Australian thin-film resistor technology for use as a key component in an Infrared Scene Projector (IRSP) for Hardware-in-the-Loop (HWIL) simulations involving systems which utilize linear rows of detectors. The tests were configured to measure spatial uniformity, temporal response, dynamic range, and relative energy output as a function of power input. D65O funding was used to purchase the resistor arrays. (MM)
Descriptors : *INFRARED DETECTORS, *THIN FILM RESISTORS, THERMAL PROPERTIES, COMPUTERIZED SIMULATION, FOREIGN TECHNOLOGY, TEMPERATURE, PHYSICAL PROPERTIES, ARRAYS, VOLTAGE, SUBSTRATES, CAMERAS, INFRARED RADIATION, BLACKBODY RADIATION, AUSTRALIA, EMITTERS, AMPLITUDE, IMAGE PROJECTORS.
Subject Categories : Electrical and Electronic Equipment
Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE