Accession Number : ADA289841

Title :   The In Situ Observation of Epitaxial Diamond Thin Film Nucleation and Growth Using Emission Electron Microscopy.

Descriptive Note : Semiannual technical rept. 1 Jan-30 Jun 94,

Corporate Author : OHIO UNIV ATHENS DEPT OF PHYSICS

Personal Author(s) : Kordesch, Martin E.

PDF Url : ADA289841

Report Date : 02 JAN 1995

Pagination or Media Count : 70

Abstract : A variety of natural and chemical vapor deposited diamond surfaces have been imaged using a photoelectron emission microscope and synchrotron radiation in the 4-18 eV and 250-350 eV range. Both images and spatially resolved total electron yield curves were acquired simultaneously. Near-edge spectra at the carbon is edge show a resonance due to graphite; the image intensity varies uniformly in proportion to the C 1s edge intensity. In the 4-18 eV range, no sharp features related to a photoemission threshold were observed below 7 eV in the electron yield curves on any of the specimens. The image contrast was not strongly dependant on the illumination energy. Natural type IIa diamond showed severe charging effects. (jg)

Descriptors :   *EMISSION, *THIN FILMS, *DIAMONDS, *EPITAXIAL GROWTH, *NUCLEATION, *ELECTRON MICROSCOPY, CONTRAST, EDGES, THRESHOLD EFFECTS, ENERGY, INTENSITY, CHEMICAL VAPOR DEPOSITION, GRAPHITE, ILLUMINATION, CARBON, PHOTOELECTRIC EMISSION, IMAGES, DIFFUSION, SULFUR, PHOTOELECTRONS, SYNCHROTRON RADIATION, SHARPNESS.

Subject Categories : Inorganic Chemistry
      Physical Chemistry
      Crystallography
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE