Accession Number : ADA289940
Title : The Measurement Of Adhesion At Film-Substrate Interfaces Using A Constant Depth Scratch Test.
Descriptive Note : Master's thesis,
Corporate Author : NAVAL POSTGRADUATE SCHOOL MONTEREY CA
Personal Author(s) : Campbell, John C.
PDF Url : ADA289940
Report Date : DEC 1994
Pagination or Media Count : 103
Abstract : By using a constant depth scratch test, the interfaces shear strength of various thin film/substrate interfaces can be determined. The ability to quantitatively ascertain when thin film debonding occurs has become especially important in the fields of electronics, optics, and protective coatings. A new model and experimental apparatus have been developed in order to more accurately determine thin film interfacial shear strength. While other tests are either qualitative in nature or experimentally difficult, the constant depth scratch test, which utilizes a Vickers microindenter for scratching a film/substrate system to debond the interface, produces quantitative results that are based upon a simple model. Since the depth is maintained constant during scratching, the complexity of the analytical formulation is reduced considerably, enabling the calculation of a numerical value for shear stress. Tests were conducted on chromium films on glass, gold thin films on aluminum nitride, and diamond films on aluminum nitride in order to determine and compare various interfacial shear strengths. (AN)
Descriptors : *ADHESION, *THIN FILMS, *SHEAR STRENGTH, TEST AND EVALUATION, MATHEMATICAL MODELS, TENSILE STRENGTH, EXPERIMENTAL DATA, ALUMINUM COMPOUNDS, QUANTITATIVE ANALYSIS, INTERFACES, LOADS(FORCES), COMPARISON, THESES, DIAMONDS, SUBSTRATES, GLASS, DEPTH, PENETRATION, SHEAR STRESSES, PROTECTIVE COATINGS, CHROMIUM, GOLD, NITRIDES.
Subject Categories : Mechanics
Distribution Statement : APPROVED FOR PUBLIC RELEASE