Accession Number : ADA290075
Title : Characterization and Calibration of a Pulsed Laser System for Single Event Upset Simulation.
Descriptive Note : DREO rept.,
Corporate Author : DEFENCE RESEARCH ESTABLISHMENT OTTAWA (ONTARIO)
Personal Author(s) : Pepper, G. T. ; Fechete, A.
PDF Url : ADA290075
Report Date : NOV 1994
Pagination or Media Count : 44
Abstract : A pulsed Nd: Glass laser facility that was developed at Defence Research Establishment Ottawa, for the simulation of single event upsets (SEUs) in electronics, is described in detail. The performance of the laser system, the associated instrumentation and data acquisition systems were extensively characterized during the process of studying the charge collected in a silicon p-i-n photodiode, due to laser and ion-induced SEU. Laser simulation of SEUs is demonstrated to be an accurate and convenient complementary method to ion accelerator-based SEU experimentation. (MM)
Descriptors : *SEMICONDUCTOR DEVICES, *PULSED LASERS, *ION ACCELERATORS, *GLASS LASERS, Q SWITCHING, SIMULATION, LASER BEAMS, DATA ACQUISITION, CALIBRATION, REFRACTION, PHOTODETECTORS, PHOTODIODES, PIN DIODES.
Subject Categories : Lasers and Masers
Distribution Statement : APPROVED FOR PUBLIC RELEASE