Accession Number : ADA291058
Title : Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics.
Descriptive Note : Technical rept. 1 Oct 90-30 Sep 92,
Corporate Author : BOEING DEFENSE AND SPACE GROUP SEATTLE WA
Personal Author(s) : Taber, Allen H. ; Normand, Eugene
PDF Url : ADA291058
Report Date : 01 FEB 1995
Pagination or Media Count : 93
Abstract : Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64k and 256k static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction (EDAC) circuitry be considered for all new avionics designs containing large amounts of semiconductor memory. (MM)
Descriptors : *AVIONICS, *ELECTRONIC EQUIPMENT, *SOLAR RADIATION, *RADIATION HARDENING, *RADIATION DAMAGE, *COSMIC RAYS, IONS, AIRCRAFT, MILITARY AIRCRAFT, INTERACTIONS, INTEGRATED CIRCUITS, SEMICONDUCTORS, MEMORY DEVICES, MICROELECTRONICS, SPACE SHUTTLES, TERRESTRIAL RADIATION, ALTITUDE, RELIABILITY(ELECTRONICS), NEUTRONS, ERROR CORRECTION CODES, RADIATION MEASURING INSTRUMENTS, RADIATION DOSAGE, ERROR DETECTION CODES, DOSIMETRY.
Subject Categories : Aircraft
Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE