Accession Number : ADA291410

Title :   Epitaxial Growth of High Quality SiC of Pulsed Laser Deposition. Phase 1.

Descriptive Note : Final rept. 21 Jul 94-21 Jan 95,

Corporate Author : ADVANCED FUEL RESEARCH INC EAST HARTFORD CT

Personal Author(s) : Hamblen, David G. ; Fenner, David B. ; Rosenthal, Peter A. ; Cosgrove, Joseph ; Kung, Pang-Jen

PDF Url : ADA291410

Report Date : 20 FEB 1995

Pagination or Media Count : 44

Abstract : The goal of this research program is to develop Pulsed Laser Deposition (PLD) as a method for depositing device quality, single crystal silicon carbide (SiC) thin films. Phase I has demonstrated the ability to deposit single crystal 3C-SiC thin films on Si (100) and 6H-SiC (0001) substrates. An existing PLD facility was improved for SiC depositions. Prior to PLD, all substrates were prepared using a novel spin etch technique. Numerous experiments explored the effect of substrate temperature and laser fluence on the resulting SiC films. Composition of the films was measured by Rutherford backscattering spectrometry and Scanning Auger Microprobe. The films were slightly carbon-rich although the excess carbon component was attributed to background contaminants in our vacuum system. Optical analyses included Fourier Transform infrared (FT-IR) spectroscopy. Epitaxy of the 3C-SiC films was confirmed by x-ray diffraction, transmission electron microscopy, and electron diffraction. Epitaxial SiC films were grown on Si (100) at temperatures as low as 930 deg C, although the crystallinity of the films improved with increasing temperature. The best films result at laser fluences of 1.5 - 2 J/sq cm. Single crystal films were obtained on 6H-SiC (0001) and vicinal 6H-SiC (0001) oriented 3.5 towards (1120) at 1200 deg C.

Descriptors :   *EPITAXIAL GROWTH, *SILICON CARBIDES, SCANNING, FOURIER TRANSFORMATION, SPECTROSCOPY, THIN FILMS, X RAY DIFFRACTION, SINGLE CRYSTALS, SPECTROMETRY, SUBSTRATES, PULSED LASERS, BACKSCATTERING, LASERS, ETCHING, ELECTRON MICROSCOPY, TRANSMITTANCE, LASER APPLICATIONS, OPTICAL ANALYSIS, VACUUM APPARATUS, CONTAMINANTS, SPINNING(MOTION), INFRARED RADIATION, ELECTRON DIFFRACTION, MICROPROBES, AUGER ELECTRONS.

Subject Categories : Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE