Accession Number : ADA291853

Title :   High Temperature Electronics Assessment.

Corporate Author : ASIAN OFFICE OF AEROSPACE RESEARCH AND DEVELOPMENT APO AP 96337-0007

Personal Author(s) : Yakura, S. J.

PDF Url : ADA291853

Report Date : 07 JUN 1993

Pagination or Media Count : 6

Abstract : As part of the AFOSR initiative, the High Temperature Electronics Assessment group has successfully completed the evaluation of high temperature electronics (HTE) technology in Japan. The group consists of Prof. Robert Davis of North Carolina State University, Prof. Hadis Morkoc of the University of Illinois, Mr. Kenichiro Nakano of Wright Laboratory, and Dr. S. Joe Yakura of AQARD. Between 25 May and 2 June 93, the assessment group visited Kyoto University in Kyoto, Nichia Chemical Industries in Tokushima, Sharp in Nara, Fujitsu Limited in Kawasaki, and the National Institute for Research in Inorganic Materials in Tsukuba. A report on the current status of U.S. and Japanese HTE technology is available by contacting Dr. C. Witt of AFOSR/NE.

Descriptors :   *ELECTRONICS, THERMAL PROPERTIES, FOREIGN TECHNOLOGY, INFORMATION EXCHANGE, HIGH TEMPERATURE, JAPAN, SILICON CARBIDES, INORGANIC MATERIALS, CHEMICAL INDUSTRY.

Subject Categories : Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE