Accession Number : ADA292200

Title :   High Resolution, Large Scale Measurement Processes.

Descriptive Note : Final rept. 1 May 91-30 Jun 93,

Corporate Author : WRIGHT LAB WRIGHT-PATTERSON AFB OH

Personal Author(s) : Brown, Jeff L.

PDF Url : ADA292200

Report Date : JUL 1994

Pagination or Media Count : 34

Abstract : As spatial resolution of any measurement process increases, the amount of data per unit area (or volume) increases, leading to huge amounts of data and/or long measurement times when attempting to map small spatial variations in material properties over large spatial dimensions. It is therefore desirable to develop techniques in which high resolution information can be obtained, while maintaining the ability to cover large areas without being overwhelmed by measurement time or data. This report discusses the issues involved and seeks to formulate and advocate strategies that could guide such endeavors.

Descriptors :   *MEASUREMENT, *SURFACE ANALYSIS, *MATERIALS, *SURFACE PROPERTIES, SPATIAL DISTRIBUTION, PHYSICAL PROPERTIES, RESOLUTION, SURFACE ROUGHNESS, HIGH RESOLUTION, MICROSCOPY, TIME, VARIATIONS, HIGH DENSITY, MICROELECTRONICS, MAPS, SURFACE TEMPERATURE, MATERIALS LABORATORIES, METROLOGY.

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE