Accession Number : ADA292602

Title :   HTMIAC/CINDAS Silicon Properties Database. User's Guide.

Descriptive Note : Interim rept. no. 25,

Corporate Author : HIGH TEMPERATURE MATERIALS INFORMATION ANALYSIS CENTER WEST LAFAYETTE IN

Personal Author(s) : Ho, C. Y.

PDF Url : ADA292602

Report Date : 21 MAR 1995

Pagination or Media Count : 9

Abstract : The Silicon Properties Database presents numerical data and technical information on the properties of pure and doped silicon. Materials comprise a variety of doped silicon materials, having both n-type and p-type conduction, as well as intrinsic silicon. Property coverage includes optical (absorption coefficient, refractive index, and band gap), thermoradiative (normal spectral reflectance, angular spectral reflectance, normal spectral emittance, and normal spectral transmittance), electrical (electrical conductivity and dielectric constant), thermophysical (thermal conductivity, specific heat, thermal expansion, and lattice parameters), damage threshold (rain erosion and laser irradiation), and mechanical (elastic constants, stress-strain, yield strength under tensile, compressive, and shear loading, flexural strength, fracture toughness, and hardness). Property data for silicon that are available in the literature are widely recognized to be sensitive to variations in material related factors. Many issues that are important in determining property behavior of these materials have been sought out in our database activity. Our objective is to bring them together into a single volume (database), and to document the data and supporting information that bear upon the behavior of silicon, in particular the temperature, wavelength, and composition (purity, dopants, carrier concentration) dependence of its properties. (KAR) p. 5

Descriptors :   *DATA BASES, *USER MANUALS, *MECHANICAL PROPERTIES, *OPTICAL PROPERTIES, *ELECTRICAL PROPERTIES, *DIELECTRIC PROPERTIES, *SILICON, *THERMOPHYSICAL PROPERTIES, SHEAR PROPERTIES, ANGLES, VOLUME, DAMAGE, CONDUCTIVITY, MATERIALS, THRESHOLD EFFECTS, ELASTIC PROPERTIES, REFRACTIVE INDEX, CHARGE CARRIERS, TOUGHNESS, LASER BEAMS, ELECTRICAL CONDUCTIVITY, FRACTURE(MECHANICS), TRANSMITTANCE, PURITY, SPECTRA, THERMAL EXPANSION, CONSTANTS, FLEXURAL STRENGTH, THERMAL CONDUCTIVITY, DOPING, IRRADIATION, REFLECTANCE, YIELD STRENGTH, ABSORPTION COEFFICIENTS, SPECIFIC HEAT, P TYPE SEMICONDUCTORS, RAIN EROSION, SPECTRAL EMITTANCE.

Subject Categories : Computer Systems
      Inorganic Chemistry
      Properties of Metals and Alloys
      Electricity and Magnetism
      Optics
      Thermodynamics

Distribution Statement : APPROVED FOR PUBLIC RELEASE