Accession Number : ADA292810
Title : Optical, Thermoradiative, Thermophysical, and Mechanical Properties of Silicon.
Descriptive Note : Interim rept.,
Corporate Author : HIGH TEMPERATURE MATERIALS INFORMATION ANALYSIS CENTER WEST LAFAYETTE IN
Personal Author(s) : Bogaard, Ronald H. ; Taylor, David L.
Report Date : AUG 1994
Pagination or Media Count : 490
Abstract : This report presents numerical data and technical information on the properties of pure silicon and doped silicon materials. Materials comprise a variety of doped silicon materials, having both n-type and p-type conduction. Property coverage includes optical (absorption coefficient and refractive index), thermoradiative (normal spectral reflectance, angular spectral reflectance, normal spectral emittance, and normal spectral transmittance), thermophysical (thermal conductivity, specific heat, thermal expansion, and lattice parameter), and mechanical (elastic constants, Stress-strain, yield strength under tensile, compressive, and shear loading, flexural strength, and fracture toughness). Property data are compiled from scientific and technical literature. The compiled data are scrutinized and evaluated through an established set of selection criteria for semiconductor and infrared window materials, and are analyzed for effects due to composition (purity, dopants, carrier concentration), temperature, and wavelength. The electronic version of this report as a computerized PC-based database is also available on a diskette for use on personal computers. This electronic version is for efficient data retrieval, manipulation, and application. jg
Descriptors : *MECHANICAL PROPERTIES, *SILICON, *INFRARED OPTICAL MATERIALS, *THERMOPHYSICAL PROPERTIES, SHEAR PROPERTIES, DATA PROCESSING, ANGLES, CONDUCTIVITY, MATERIALS, NUMERICAL ANALYSIS, ELASTIC PROPERTIES, REFRACTIVE INDEX, EFFICIENCY, CHARGE CARRIERS, TOUGHNESS, FRACTURE(MECHANICS), TRANSMITTANCE, PURITY, SPECTRA, THERMAL EXPANSION, CONSTANTS, FLEXURAL STRENGTH, THERMAL CONDUCTIVITY, INFORMATION RETRIEVAL, DOPING, MICROCOMPUTERS, REFLECTANCE, YIELD STRENGTH, SELECTION, ABSORPTION COEFFICIENTS, SPECIFIC HEAT, P TYPE SEMICONDUCTORS, SCIENTIFIC LITERATURE, INFRARED WINDOWS, SPECTRAL EMITTANCE.
Subject Categories : Inorganic Chemistry
Distribution Statement : APPROVED FOR PUBLIC RELEASE