Accession Number : ADA294180
Title : Measurement and Analysis of Properties of Several Types of Films Doped with Oxides.
Corporate Author : NATIONAL AIR INTELLIGENCE CENTER WRIGHT-PATTERSON AFB OH
Personal Author(s) : Yuming, Chen ; Jinfa, Tang ; Peifu, Gu
PDF Url : ADA294180
Report Date : 05 APR 1995
Pagination or Media Count : 16
Abstract : This article introduces several types of experimental equipment associated with the measurement of stress, absorption, and scattering in thin films. It makes use of these systems to carry out measurements and tests on such characteristics as stress, absorption, scattering, focusing density, and so on, in a number of common oxides and their doping films. At the same time, with the help of Auger energy spectra techniques and X-ray diffraction technology, it analyzes the chemical constituents and crystal structure of films, obtaining a number of significant results. jg
Descriptors : *THIN FILMS, *OXIDES, *DOPING, STRESSES, DENSITY, MEASUREMENT, SCATTERING, CRYSTAL STRUCTURE, ENERGY, X RAY DIFFRACTION, FILMS, CHEMICAL COMPOSITION, SPECTRA, FOCUSING, TRANSLATIONS, ABSORPTION, AUGERS, CHINA, CHINESE LANGUAGE.
Subject Categories : Solid State Physics
Laminates and Composite Materials
Distribution Statement : APPROVED FOR PUBLIC RELEASE