Accession Number : ADA295450
Title : Guidelines for Developing Radiation Hardness Assurance Device Specifications.
Descriptive Note : Memorandum rept.,
Corporate Author : NAVAL RESEARCH LAB WASHINGTON DC
Personal Author(s) : Wolicki, Eligius A. ; Namenson, Arthur ; Carlan, Alan
PDF Url : ADA295450
Report Date : 12 JUN 1995
Pagination or Media Count : 88
Abstract : This document discusses how data on the performance of an electronic part should be taken and documented so that it can be easily analyzed and how end-point limits for pass-fail lot acceptance tests should be calculated. Although these guidelines specifically address the problem of radiation hardness, many of the discussions given may be useful more generally to persons responsible for electrical response measurements, the development of procurement specifications, and for system design and the selection of Pats for complex electronic systems. A considerable portion of this document addresses the various problems that can appear in data measurements. These discussions emphasize that it is crucial to examine the data carefully to ensure that it is both accurate and representative of the part type which has been sampled for the measurements. The benefits of overstress testing are discussed in Appendix III and a table is given showing how much can be gained for part survivability with such testing. (MM)
Descriptors : *NUCLEAR EXPLOSIONS, *ELECTRONIC EQUIPMENT, *INTEGRATED CIRCUITS, *SEMICONDUCTORS, *NUCLEAR RADIATION, *MICROCIRCUITS, *RADIATION HARDENING, SURVIVABILITY, SPECIFICATIONS, MILITARY STANDARDS, GALLIUM ARSENIDES, DAMAGE ASSESSMENT, PROBABILITY, IRRADIATION, QUALITY ASSURANCE, MILITARY PROCUREMENT, IONIZING RADIATION, NEUTRONS, RADIATION MEASURING INSTRUMENTS, RADIATION DOSAGE, TRANSISTORS.
Subject Categories : Electromagnetic Shielding
Nuclear Radiation Shield, Protection & Safety
Distribution Statement : APPROVED FOR PUBLIC RELEASE