Accession Number : ADA297009

Title :   Uncertainties in Reflectance Measurements Made on the NRL Beam Line X24C.

Descriptive Note : Memorandum rept.,

Corporate Author : NAVAL RESEARCH LAB WASHINGTON DC

PDF Url : ADA297009

Report Date : 17 JUL 1995

Pagination or Media Count : 26

Abstract : A comprehensive attempt has been made to identify and quantify sources of uncertainty associated with measurements made with the reflectometer on the NRL beam line X24C. Measuremental uncertainty is dominated by angular reproducibility in the reflectometer and the stability of the electron beam. At wavelengths near the silicon L edge, the error in wavelength scale, set by the monochromator, is about 0.3 Angstroms. In samples with good signal to noise, the error in the reflectance is about 1 % of the value of the reflectance. The error is correlated with the slope of the reflectance profile, varying between 1 % of the reflectance value where the slope is flat to 10% of the reflectance value where the slope is steep.

Descriptors :   *ELECTRON BEAMS, *REFLECTANCE, *SYNCHROTRON RADIATION, ANGLES, MEASUREMENT, UNCERTAINTY, SIGNAL TO NOISE RATIO, REPRODUCIBILITY, MONOCHROMATORS.

Subject Categories : Particle Accelerators

Distribution Statement : APPROVED FOR PUBLIC RELEASE