Accession Number : ADA297729

Title :   Analyzing VLSI Component Test Results of a GenRad GR125 Tester.

Descriptive Note : Interim rept. 1 Jun 94-1 Jun 95,

Corporate Author : NAVAL POSTGRADUATE SCHOOL MONTEREY CA DEPT OF ELECTRICAL AND COMPUTER ENGINEE RING

Personal Author(s) : Zulaica, D. ; Lee, C. -H.

PDF Url : ADA297729

Report Date : 30 JUN 1995

Pagination or Media Count : 37

Abstract : The GenRad GR125 VLSI chip tester provides tools for testing the functionality of entire chips. Test operation results, such as timing sensitivity or propagation delay, can be compared to published values of other manufacturers' chips. The tool opt ions allow for many input vector situations to be tested, leaving the possibility that a certain test result has no meaning. Thus, the test operations are also analyzed for intent. Automating the analysis of test results can speed up the testing process and prepare results for processing by other tools. The procedure used GR125 test results of a 7404 Hex Inverter in a sample VHDL performance modeler on a Unix workstation. The VHDL code is simulated using the Mentor Graphics Corporation's Idea Station software, but should be portable to any VHDL simulator.

Descriptors :   *VERY LARGE SCALE INTEGRATION, *CIRCUIT TESTERS, TEST AND EVALUATION, COMPUTER PROGRAMS, INPUT, STATIONS, IONS, PROPAGATION, MANUFACTURING, SPECIFICATIONS, CHIPS(ELECTRONICS), SENSITIVITY, TIME, VECTOR ANALYSIS, DELAY, WORK STATIONS, AUTOMATIC.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE