Accession Number : ADA298880

Title :   Amorphous Insulating Thin Films II. Proceedings of Symposium Held in Strasbourg, France on May 24-27, 1994,

Corporate Author : ELSEVIER SCIENCE PUBLISHERS LTD BARKING (UNITED KINGDOM)

Personal Author(s) : Devine, R. A. ; Warren, W. L. ; Kanicki, J. ; Matsumara, M.

PDF Url : ADA298880

Report Date : 1995

Pagination or Media Count : 522

Abstract : The contents of this volume of the Journal of Non-Crystalline Solids contains a large fraction of the papers presented at the symposium Amorphous Insulating Thin Films II' which took place in Strasbourg, France from 24 to 27 May 1994. The symposium was organized under the auspices of the European Materials Research Society and was a follow-up to one organized in the USA during the Fall 1992 meeting of the Materials Research Society in Boston. 113 participants were registered for the Strasbourg meeting representing more than 20 different countries from around the world. Presentations at the symposium were divided between oral and poster sessions, and for the first time we introduced the concept of an extended panel session entitled Microscopic Characterization of the Si/SiO2 Interface' during which invited speakers were asked to present different characterization methods.

Descriptors :   *THIN FILMS, *AMORPHOUS MATERIALS, OPTICAL PROPERTIES, SYMPOSIA, SILICON DIOXIDE, CERAMIC COATINGS, NITRIDES, CRYSTAL DEFECTS, FRANCE, INDUSTRIAL RESEARCH, FERROELECTRIC MATERIALS, ELECTRICAL INSULATION.

Subject Categories : Properties of Metals and Alloys

Distribution Statement : APPROVED FOR PUBLIC RELEASE