Accession Number : ADA299174

Title :   Workshop on Fielded Applications of Machine Learning Held in Amherst, Massachusetts on 30 June-1 July 1993. Abstracts.

Descriptive Note : Final rept.,

Corporate Author : SIEMENS CORPORATE RESEARCH PRINCETON NJ

PDF Url : ADA299174

Report Date : 1993

Pagination or Media Count : 5

Abstract : One of the central insights of artificial intelligence is that expert performance requires domain-specific knowledge, and work on knowledge engineering has led to many AI systems that are now regularly used in industry and elsewhere. The ultimate test of machine learning, the subfield of Al that studies the automated acquisition of knowledge, is the application of its techniques to produce similar results. Recent successes in real-world applications of machine learning suggest the time was ripe for a meeting on this topic. For this reason, Pat Langley (Siemens Corporate Research) and Yves Kodratoff (Universite de Paris, Sud) organized an invited workshop on applications of machine learning. The goal of the gathering was to familiarize participants with existing applications of computational learning methods and to explore the potential for additional ones in the private and public sector. To this end, it emphasized fielded applications that are in actual use, and it downplayed differences among the specific learning methods employed, focusing instead on the machinations necessary to obtain successful results in real-world domains. The meeting took place at the University of Massachusetts, Amherst, on June 30 and July 1, 1993, immediately following the Tenth International Conference on Machine Learning. Approximately 30 participants listened to 12 invited presentations, most of which dealt with specific applications of machine learning. The attendees also took part in lively discussions about the issues that arise in developing fielded applications, the relation of such work to the rest of machine learning, and the potential for future applications.

Descriptors :   *LEARNING MACHINES, *ARTIFICIAL INTELLIGENCE, TEST AND EVALUATION, SYMPOSIA, INDUSTRIES, AUTOMATION, FRANCE, DATA ACQUISITION, UNIVERSITIES, INTERNATIONAL, NUMERICAL METHODS AND PROCEDURES, LEARNING, MASSACHUSETTS.

Subject Categories : Cybernetics

Distribution Statement : APPROVED FOR PUBLIC RELEASE