Accession Number : ADA301195

Title :   Effect of Long-Term Storage on Electronic Devices.

Descriptive Note : Final rept. Aug 93-Jul 95,

Corporate Author : PECHT ASSOCIATES INC HYATTSVILLE MD

Personal Author(s) : Martinelli, Joseph

PDF Url : ADA301195

Report Date : NOV 1995

Pagination or Media Count : 127

Abstract : This Phase II project identifies physics-of-failure based models for the dominant failure mechanisms in microelectronic packages subject to long-term storage; provides a user-friendly interactive software tool to assess the reliability of infrared (IR) and millimeter wave (MMW) sensors and associated smart munition electronic packages; and, provides a software tool to aid in defining tests for long term reliability and identifying failure mechanisms in electronic packaging methods, technologies, materials and designs. Through a questionnaire and literature search, failure mechanisms and models were identified. The questionnaire, requesting failure mechanisms, accelerated test and field reliability information for IR and MMW devices, was sent to experts from many organizations. The responses and literature search provided background for the engineering reference text titled, 'Long-term Non-operating Reliability of Electronic Devices.' Another part of this project was the development of CADMP-lle, a software tool which facilitates the physics-of-failure reliability analysis for microcircuits subject to long-term storage. Inputs to the software include geometric. material, and mounting characteristics of the device. Many storage environments are part of the software's environment database. CADMP-IIe can analyze MMW and IR package architectures using failure models and material properties that were added. The software provides a useful design aid to assess storage reliability allowing the user to determine time-to-failure and to rank the dominance of each potential failure mechanism.

Descriptors :   *COMPUTER PROGRAMS, *ELECTRONIC EQUIPMENT, *RELIABILITY, *FAILURE(MECHANICS), TEST AND EVALUATION, DATA BASES, ENVIRONMENTS, MODELS, LITERATURE SURVEYS, COMPUTER ARCHITECTURE, MILLIMETER WAVES, LONG RANGE(TIME), MICROELECTRONICS, AMMUNITION, PACKAGING, INFRARED DETECTORS, MOUNTS, LIFE CYCLES, STORAGE, ACCELERATED TESTING, USER FRIENDLY.

Subject Categories : Electrical and Electronic Equipment
      Computer Programming and Software
      Mechanics

Distribution Statement : APPROVED FOR PUBLIC RELEASE