Accession Number : ADA304039
Title : Instrumentation for Spatially Resolved Composition Mapping in the Electron Microscope.
Descriptive Note : Final rept. 1 Nov 94-1 Nov 95,
Corporate Author : MASSACHUSETTS UNIV AMHERST DEPT OF POLYMER SCIENCE AND ENGINEERING
Personal Author(s) : Gido, Samuel P.
PDF Url : ADA304039
Report Date : 11 DEC 1995
Pagination or Media Count : 8
Abstract : Analytical equipment for spatially resolved composition mapping in the electron microscope has been purchased in accordance with the originally proposed intent of the grant. A scanning beam attachment for scanning transmission electron microscopy (STEM) has been acquired as well as attachments for composition mapping utilizing characteristic X-ray signals (EDS) and electron energy loss signals (Gatan Imaging Filter).
Descriptors : *ELECTRON MICROSCOPY, *TRANSMITTANCE, *ELECTRON SPECTROSCOPY, SCANNING, SCANNING ELECTRON MICROSCOPES, ELECTRON MICROSCOPES, ELECTRONIC SCANNERS, X RAYS, ELECTRON ENERGY, IMAGES, ELECTROMAGNETIC WAVE FILTERS.
Subject Categories : Atomic and Molecular Physics and Spectroscopy
Distribution Statement : APPROVED FOR PUBLIC RELEASE