Accession Number : ADA304328

Title :   The Deposition of Electro-Optic Films on Semiconductors.

Descriptive Note : Final project rept. 1 Jan 91-31 Dec 94,

Corporate Author : NORTH CAROLINA STATE UNIV AT RALEIGH DEPT OF MATERIALS SCIENCE AND ENGINEERING

Personal Author(s) : Kingon, Angus I. ; Auciello, Orlando H. ; Bachmann, Klaus J. ; Chow, Alice F.

PDF Url : ADA304328

Report Date : FEB 1996

Pagination or Media Count : 88

Abstract : Highly epitaxial, dense, and reproducible KNbO3 thin films were produced using a unique ion beam deposition method and characterized using x-ray diffraction, Rutherford backscattering spectroscopy, atomic force microscopy, transmission electron microscopy, prism coupling, and optical loss measurements. Second harmonic generation (SHG) was demonstrated for these thin films where infrared light was doubled in frequency to green by phase-matching in a KNbO3 thin planer waveguide. The current obstacle limiting the development of KNbO3 thin film waveguides is high optical losses. In this study optical losses in these KNbO3 thin films were correlated with different film microstructures to determine the dominant loss mechanisms. It has been shown that volume absorption, interface scattering, and domain boundary scattering all contribute to the high optical losses measured. The KNbO3 thin films were also integrated with Si, GaAs, and Al2O3 substrates using an MgO buffer layer. jg p1

Descriptors :   *ELECTROOPTICS, *FILMS, *SEMICONDUCTORS, *DEPOSITION, COUPLING(INTERACTION), BUFFERS, MEASUREMENT, OPTICAL PROPERTIES, SCATTERING, MICROSTRUCTURE, HIGH RATE, SPECTROSCOPY, INTERFACES, LAYERS, SECOND HARMONIC GENERATION, GALLIUM ARSENIDES, THIN FILMS, X RAY DIFFRACTION, EPITAXIAL GROWTH, SUBSTRATES, ION BEAMS, BACKSCATTERING, ELECTRON MICROSCOPY, TRANSMITTANCE, BOUNDARIES, ALUMINUM OXIDES, SILICON, LOSSES, ABSORPTION, INFRARED RADIATION, POTASSIUM, PRISMS(OPTICS), MAGNESIUM OXIDES, NIOBATES.

Subject Categories : Laminates and Composite Materials
      Inorganic Chemistry
      Electrical and Electronic Equipment
      Atomic and Molecular Physics and Spectroscopy
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE