Accession Number : ADA307159

Title :   A Network Charge-Oriented MOS Transistor Model,

Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE ARTIFICIAL INTELLIGENCE LAB

Personal Author(s) : Katzenelson, Jacob ; Unikovski, Aharon

PDF Url : ADA307159

Report Date : AUG 1995

Pagination or Media Count : 41

Abstract : The MOS transistor physical model as described in (3) IS PRESENTED HERE AS A NETWORK MODEL. The goal is to obtain an accurate model, suitable for simulation, free from certain problems reported in the literature (13), and conceptually as simple as possible. To achieve this goal the original model had to be extended and modified. The paper presents the derivation of the network model from physical equations, including the corrections which are required for simulation and which compensate for simplifications introduced in the original physical model. Our intrinsic MOS model consists of three nonlinear voltage-controlled capacitors and a dependent current source. The charges of the capacitors and the current of the current source are functions of the voltages Vgs, Vbs, and Vds. The complete model consists of the intrinsic model plus the parasitics. The apparent simplicity of the model is a result of hiding information in the characteristics of the nonlinear components. The resulted network model has been checked by simulation and analysis. It is shown that the network model is suitable for simulation: It is defined for any value of the voltages; the functions involved are continuous and satisfy Lipschitz conditions with no jumps at region boundaries; Derivatives have been computed symbolically and are available for use by the Newton-Raphson method. The model's functions can be measured from the terminals. It is also shown that small channel effects can be included in the model. Higher frequency effects can be modeled by using a network consisting of several sections of the basic lumped model. Future plans include a detailed comparison of the network model with models such as SPICE level 3 and a comparison of the multi-section higher frequency model with experiments.

Descriptors :   *METAL OXIDE SEMICONDUCTORS, *TRANSISTORS, MATHEMATICAL MODELS, COMPUTERIZED SIMULATION, NEURAL NETS, GATES(CIRCUITS), VOLTAGE, CURRENT DENSITY, INTEGRATED CIRCUITS, NONLINEAR SYSTEMS, CIRCUIT INTERCONNECTIONS, PARTIAL DIFFERENTIAL EQUATIONS, ARTIFICIAL INTELLIGENCE, SYSTEMS ANALYSIS, CHARGE DENSITY, NONLINEAR ANALYSIS, ELECTRIC CURRENT, ELECTRICAL NETWORKS, VOLTAGE REGULATION, CIRCUIT ANALYSIS, CAPACITANCE, CAPACITORS.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE