Accession Number : ADA309676

Title :   An Ultrafast Tunneling Sampler for Atomic-Resolution, High-Speed Electronic Measurements.

Descriptive Note : Final rept. 15 May 92-30 Sep 95,

Corporate Author : STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS

Personal Author(s) : Nechay, B. A. ; Hou, A. S. ; Ho, F. ; Bloom, D. M.

PDF Url : ADA309676

Report Date : MAY 1996

Pagination or Media Count : 45

Abstract : A non-contact probe has been invented and developed for time resolved measurement of electrical waveforms with features as fast as one picosecond. The technique is based on atomic force microscopy modified for electrical sampling. Two generations of probe heads were designed, built, and tested. The fundamental limits of the system, including spatial, temporal, and voltage resolution, have been investigated. State of the art integrated circuits from Intel and National Semiconductor were tested with nanosecond resolution to show that the instrument has potential industrial application. U.S. Patents 5,381,101 and 5,488,305 were granted to Stanford University and licensed to industry. A GaAs nonlinear transmission line was monolithically integrated with a specially designed high speed cantilever and used to probe transients less than one picosecond in duration. Harmonic mixing frequencies as high as 333 GHz were measured.

Descriptors :   *TUNNELING(ELECTRONICS), *INTEGRATED CIRCUITS, TRANSIENTS, ELECTRONICS, PROBES, HIGH RATE, GALLIUM ARSENIDES, HARMONICS, TRANSMISSION LINES, SEMICONDUCTORS, NONLINEAR SYSTEMS, SUBMILLIMETER WAVES, SAMPLERS, ELECTRICAL MEASUREMENT, MIXERS(ELECTRONICS).

Subject Categories : Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE