Accession Number : ADA311822
Title : Finite Element Modeling and Analysis of MCM High Density Interconnect Vias.
Descriptive Note : Final rept. Apr 94-Apr 95,
Corporate Author : MASSACHUSETTS UNIV AMHERST DEPT OF MECHANICAL ENGINEERING
Personal Author(s) : Grosse, I. ; DiTomasso, J.
PDF Url : ADA311822
Report Date : JUN 1996
Pagination or Media Count : 100
Abstract : Failure modes of vias within a chip's first multi-chip module are studied using several two and three-dimensional families of finite element models. The models study both the global strains of the entire module and local strains of a single via under uniform temperature loading between -65 deg C and 120 deg C. The accuracy of the models was verified by comparing different families of models with each other, with analytical beam theory, and with empirical data generated by electron beam moire strain data taken by NIST on a test specimen. Global finite element analysis results revealed that the strains within the high density interconnect layer have only a 10% effect upon the local via strains. A simple analytical method was developed to obtain displacement boundary conditions to be applied to local via finite element models, thereby precluding the need for global finite element analysis of the entire module. For a local via analysis, the axisymmetric and three-dimensional finite element models were found to predict the location of via failures, which agrees with failure locations observed under accelerated test conditions. A number of via design factors were identified that affect the strain concentration in the via wall. However, the dielectric/epoxy intermaterial boundary was not found to be the cause of the strain concentration in the via wall.
Descriptors : *STRESS ANALYSIS, *FINITE ELEMENT ANALYSIS, *CHIPS(ELECTRONICS), *MODULES(ELECTRONICS), STRESS STRAIN RELATIONS, MATHEMATICAL MODELS, DIELECTRICS, ACCURACY, CRACK PROPAGATION, COPPER, ALUMINUM, THERMAL EXPANSION, SILICON, HIGH DENSITY, MICROELECTRONICS, CIRCUIT INTERCONNECTIONS, SYSTEMS ANALYSIS, NONLINEAR ANALYSIS, EPOXY COMPOSITES, RELIABILITY(ELECTRONICS), THERMAL STRESSES, CIRCUIT ANALYSIS, FAILURE(ELECTRONICS), STRESS CONCENTRATION.
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE