Accession Number : ADA313308

Title :   Scanning Tunneling Microscopy and Low Energy Electron Microscopy of Metal Overlayers on Metal Surfaces.

Descriptive Note : Final technical rept.,

Corporate Author : IBM ALMADEN RESEARCH CENTER SAN JOSE CA

Personal Author(s) : Wilson, Robert J. ; Chambliss, David D.

PDF Url : ADA313308

Report Date : 1995

Pagination or Media Count : 47

Abstract : Thin metal films are of ever increasing importance as the scale of devices shrinks. In order to provide new insight into the atomic details of metal film structure and the nanoscopic details of magnetic domains, efforts were made to study thin metal films on tungsten single crystals using both scanning tunneling microscopy (STM) and spin polarized low energy electron microscopy (SPLEEM). Difficulties were encountered with the as-delivered SPLEEM instrument which required extensive efforts to rectify. STM investigators were directed towards understanding the structure of multilayer metal films on W(111) and Al2O3(0001). Atomic models for a number of different and complex surface structures are derived for Au films on W(l10) for coverages between 0.5 and 5 monolayers. STM studies of sputter deposited Pt films on sapphire substrates, for use as seed layers for epitaxial spin valves, are described. By varying the Pt layer thickness and deposition temperature, continuous epitaxial thin films were developed. An epitaxial spin valve was constructed and assessed by magneto-transport measurements. Future opportunities for improved understanding of magnetic and electrical phenomena in thin films are briefly described. p1

Descriptors :   *SCANNING ELECTRON MICROSCOPES, *TUNNELING(ELECTRONICS), *METAL FILMS, *ELECTRON MICROSCOPY, *SURFACES, *LOW ENERGY, ELECTRONIC SCANNERS, THIN FILMS, SINGLE CRYSTALS, EPITAXIAL GROWTH, SUBSTRATES, ELECTRICAL PROPERTIES, SAPPHIRE, ELECTRON ENERGY, VALVES, SPUTTERING, TUNGSTEN, MAGNETIC DOMAINS.

Subject Categories : Inorganic Chemistry
      Electrical and Electronic Equipment
      Properties of Metals and Alloys
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE