Accession Number : ADA313848

Title :   Particle Surface Layer Characterization Using Ion Beam Analysis.

Descriptive Note : Final rept. Jun 90-Aug 92,

Corporate Author : ARMY RESEARCH LAB ABERDEEN PROVING GROUND MD

Personal Author(s) : Berning, Paul R. ; Niiler, Andrus

PDF Url : ADA313848

Report Date : AUG 1996

Pagination or Media Count : 42

Abstract : Surface contaminants on powders used in powder metallurgy and ceramics processing can be responsible for serious degradation of the product properties. The elimination of such contamination, or at least the tailoring of its properties for improved performance, requires the ability to determine its nature accurately. Ion beam analysis techniques are used to provide quantitative characterization of such contamination. In this report, we describe two methods for adapting well-known backscattering spectroscopy techniques for use on samples consisting of small spherical or cylindrical particles. The limitations and relative strengths and weaknesses, of each method will be discussed. Examples of the use of these methods in conjunction with Rutherford Backscattering Spectroscopy will be shown, although they are also applicable to other types of ion beam analysis.

Descriptors :   *CERAMIC MATERIALS, *CONTAMINANTS, *POWDER METALS, QUANTITATIVE ANALYSIS, DEGRADATION, LAYERS, POWDERS, ION BEAMS, BACKSCATTERING, SURFACES, PARTICLES, OXIDES, POWDER METALLURGY.

Subject Categories : Metallurgy and Metallography
      Fabrication Metallurgy

Distribution Statement : APPROVED FOR PUBLIC RELEASE