Accession Number : ADA314089

Title :   Reliability Assessment of Opto-Electronic Integrated Circuits.

Descriptive Note : Final rept.,

Corporate Author : UNIPHASE TELECOMMUNICATIONS PRODUCTS BLOOMFIELD CT

Personal Author(s) : Kissa, Karl M. ; Eng, Hogan

PDF Url : ADA314089

Report Date : JUL 1996

Pagination or Media Count : 78

Abstract : This effort examined the functionality of 30 emitter coupled, logic, compatible phase modulators and 30 bias controlled modulators under various environments. The devices were subjected to thermal cycling, vibration, and temperature/humidity to evaluate the long-term performance of the optical and electronic portions of the devices. Thermal cycling and vibration testing did not cause optical failures. Subjecting the devices to high temperatures combined with high humidity (85 deg C/90% relative humidity) resulted in failures in the lid and fiber seal. Once moisture is allowed to enter the package, the water vapor reacts with the epoxies in the package, which then soften and darken. Laser welding the package lid and newly developed humidity resistant fiber seals extend the survival range to over 2,000 hours at 100 deg C/100% humidity.

Descriptors :   *INTEGRATED CIRCUITS, *CIRCUIT TESTERS, *RELIABILITY(ELECTRONICS), TEST AND EVALUATION, TEMPERATURE, FIBERS, VIBRATION, ELECTROOPTICS, HIGH TEMPERATURE, LONG RANGE(TIME), SURVIVAL(GENERAL), CYCLES, RELIABILITY, HEATING, RADIO LINKS, EPOXY COMPOUNDS, SEALS(STOPPERS), HUMIDITY, PHASE MODULATION, WATER VAPOR, HIGH HUMIDITY, LASER WELDING.

Subject Categories : Electrical and Electronic Equipment
      Electrooptical and Optoelectronic Devices

Distribution Statement : APPROVED FOR PUBLIC RELEASE