Accession Number : ADA316102
Title : Student Support for Chemical Interdiffusion Studies at Pseudomorphic Interfaces.
Descriptive Note : Final technical rept. 1 May 95-30 Apr 96,
Corporate Author : NORTH CAROLINA STATE UNIV AT RALEIGH
Personal Author(s) : Davis, Robert F.
PDF Url : ADA316102
Report Date : SEP 1996
Pagination or Media Count : 8
Abstract : Uncertainty in the extent of solid solution formation in the SiC-AlN system has continued to exist for temperatures <2000 deg C. This uncertainty has been surmounted via chemical interdiffusion investigations between epitaxial, monocrystalline 2H-AlN(0001) films and their associated 6H-SiC(0001) substrates between 1700 deg and 1850 deg C. The characterization tools of Auger spectroscopy, transmission electron microscopy, and parallel electron energy loss spectroscopy have been employed to determine the diffusion profiles across the AlN/SiC interfaces. This research has found no evidence of interdiffusion between AlN and SiC and thus proven that pure AlN and SiC do not form measurable solid solutions below 1850 deg C.
Descriptors : *CHEMISTRY, *ALUMINUM, *DIFFUSION, *SOLID SOLUTIONS, *SILICON CARBIDES, UNCERTAINTY, TOOLS, CHEMICALS, INTERFACES, EPITAXIAL GROWTH, CRYSTALS, NITRIDES, ELECTRON MICROSCOPY, TRANSMITTANCE, AUGER ELECTRON SPECTROSCOPY.
Subject Categories : Inorganic Chemistry
Atomic and Molecular Physics and Spectroscopy
Distribution Statement : APPROVED FOR PUBLIC RELEASE