Accession Number : ADA317319
Title : In Situ STM and UHV-EC: Complementary, not Competiting, Techniques.
Descriptive Note : Technical rept. 1 Jun 95-15 Oct 96,
Corporate Author : GEORGIA UNIV ATHENS DEPT OF CHEMISTRY
Personal Author(s) : Soriaga, Manuel P. ; Itaya, Kingo ; Stickney, John L.
PDF Url : ADA317319
Report Date : 15 OCT 1996
Pagination or Media Count : 17
Abstract : The development of in situ scanning tunneling microscopy (STM) has opened new avenues of research in electrochemical surface science. By itself, this nanometerscale structural tool cannot be regarded as a panacea for the many problems that confront researchers in the interfacial sciences. However, when employed in tandem with other surface-sensitive analytical methods, even exceedingly complex processes can be investigated. Two cases are presented here that showcase the power of in situ STM coupled with combined ultrahigh vacuum-electrochemistry (UHV-EC) techniques.
Descriptors : *INTERFACES, *ELECTROCHEMISTRY, *ELECTRON MICROSCOPY, *ULTRAHIGH VACUUM, TOOLS, STRUCTURAL PROPERTIES, TUNNELING(ELECTRONICS), ELECTRONIC SCANNERS, SURFACES.
Subject Categories : Physical Chemistry
Test Facilities, Equipment and Methods
Atomic and Molecular Physics and Spectroscopy
Distribution Statement : APPROVED FOR PUBLIC RELEASE