Accession Number : ADA317319

Title :   In Situ STM and UHV-EC: Complementary, not Competiting, Techniques.

Descriptive Note : Technical rept. 1 Jun 95-15 Oct 96,

Corporate Author : GEORGIA UNIV ATHENS DEPT OF CHEMISTRY

Personal Author(s) : Soriaga, Manuel P. ; Itaya, Kingo ; Stickney, John L.

PDF Url : ADA317319

Report Date : 15 OCT 1996

Pagination or Media Count : 17

Abstract : The development of in situ scanning tunneling microscopy (STM) has opened new avenues of research in electrochemical surface science. By itself, this nanometerscale structural tool cannot be regarded as a panacea for the many problems that confront researchers in the interfacial sciences. However, when employed in tandem with other surface-sensitive analytical methods, even exceedingly complex processes can be investigated. Two cases are presented here that showcase the power of in situ STM coupled with combined ultrahigh vacuum-electrochemistry (UHV-EC) techniques.

Descriptors :   *INTERFACES, *ELECTROCHEMISTRY, *ELECTRON MICROSCOPY, *ULTRAHIGH VACUUM, TOOLS, STRUCTURAL PROPERTIES, TUNNELING(ELECTRONICS), ELECTRONIC SCANNERS, SURFACES.

Subject Categories : Physical Chemistry
      Test Facilities, Equipment and Methods
      Atomic and Molecular Physics and Spectroscopy
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE