Accession Number : ADA320297
Title : Development of a Holographic System for Avionics Durability Analysis and Validation Volume 1 - Text.
Descriptive Note : Final rept. 7 Jan 91-29 Feb 96,
Corporate Author : WORCESTER POLYTECHNIC INST MA DEPT OF MECHANICAL ENGINEERING
Personal Author(s) : Pryputniewicz, Ryszard J.
PDF Url : ADA320297
Report Date : FEB 1996
Pagination or Media Count : 359
Abstract : This report documents the development of an Electro-Optic Holography (EOH) system for the measurement of mechanical displacements and strains on the microscale structures employed in current technology avionics. It begins with a description of the processes and mathematics of holography. This includes explanations of the illumination, observation, and sensitivity vectors as well as their relationships to the projection matrices. Next is a discussion and detailed mathematical development of the interpretation of holograms (both conventional and time-averaged) to extract displacement, rotation, and strain measurements. Experimental results illustrate the analysis. This is followed by a description of the EOH technique which includes a description of the experimental apparatus and measurement procedures, discussion of the computer based processing used to analyze the electronically captured interference images, procedures for the determination of three dimensional displacements, and a brief description of Electronic Shearography to contrast the two techniques. Experimental measurements of deformations in avionics are shown along with a discussion of how the EOH results can be merged with Finite Element Modeling (FEM) techniques during system design. This includes the description of a hybrid procedure to optimize the design for a specific target characteristic. Examples for the optimization of a cantilever plate are presented and discussed.
Descriptors : *AVIONICS, *SYSTEMS ENGINEERING, *ELECTROOPTICS, *HOLOGRAPHY, MATHEMATICAL MODELS, MEASUREMENT, MECHANICAL PROPERTIES, VIBRATION, EXPERIMENTAL DATA, OPTIMIZATION, NONDESTRUCTIVE TESTING, VALIDATION, COMPUTERS, FINITE ELEMENT ANALYSIS, DEFORMATION, DISPLACEMENT, ILLUMINATION, TARGETS, TIME, THREE DIMENSIONAL, INTERFEROMETRY, HYBRID SYSTEMS, MEAN, HOLOGRAMS, MICROBALANCES.
Subject Categories : Electrical and Electronic Equipment
Electrooptical and Optoelectronic Devices
Distribution Statement : APPROVED FOR PUBLIC RELEASE