Accession Number : ADA322563
Title : Design of a Universal Test Platform for Radiation Testing of Digital Components.
Descriptive Note : Master's thesis,
Corporate Author : NAVAL POSTGRADUATE SCHOOL MONTEREY CA
Personal Author(s) : Amsler, Duane E., Jr
PDF Url : ADA322563
Report Date : SEP 1996
Pagination or Media Count : 195
Abstract : In this research, programmable, microcontroller-based test hardware was designed, constructed, debugged, and programmed. The wire-wrapped board will be used to test two custom static random access memory (SRAM) chips, as well as other custom chips designed at the Naval Postgraduate School. Components for the test hardware were selected to allow prototyping with standard parts that can later be replaced with radiation hardened parts as budgets permit. Control of the test hardware is via a RS-232 serial interface, which allows remote control programming and monitoring of the test hardware and device being tested.
Descriptors : *VERY LARGE SCALE INTEGRATION, *CHIPS(ELECTRONICS), *RANDOM ACCESS COMPUTER STORAGE, *RADIATION HARDENING, TEST AND EVALUATION, MICROPROCESSORS, GALLIUM ARSENIDES, THESES, INPUT OUTPUT PROCESSING, MICROELECTRONICS, CIRCUIT BOARDS, REMOTE CONTROL, DIGITAL COMPUTERS, DIGITAL COMBINERS, TEST FIXTURES, CRYSTAL OSCILLATORS.
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE