Accession Number : ADA325726
Title : Advanced Electro-Optical System Hardening: Phase II: Computer-Aided Susceptibility Analysis of the HOST Sensor Amplifier to IEMP.
Descriptive Note : Final rept.
Corporate Author : GENERAL RESEARCH CORP MCLEAN VA
Personal Author(s) : Gilbert, John L.
PDF Url : ADA325726
Report Date : DEC 1974
Pagination or Media Count : 43
Abstract : This report supplied support to the Harry Diamond Laboratories on the effects of IEMP-induced transient pulses on the HOST detector amplifier. Computer simulation techniques were used to model the circuit's response to 1-microsecond current pulses injected at the selected circuit locations. The most vulnerable subcircuit within the amplifier was found to be the detector bias power supply. Permanent damage was predicted to occur at the bias control input point for a cable response, resulting in the pickup of a 61-V, 0.064-A pulse, or greater.
Descriptors : *ELECTROOPTICS, DAMAGE ASSESSMENT, VULNERABILITY, POWER AMPLIFIERS, OPTICAL DETECTORS, COMPUTER AIDED DIAGNOSIS, CIRCUIT ANALYSIS, ELECTROMAGNETIC PULSES, ELECTROMAGNETIC SUSCEPTIBILITY.
Subject Categories : Electrooptical and Optoelectronic Devices
Electricity and Magnetism
Distribution Statement : APPROVED FOR PUBLIC RELEASE