Accession Number : ADA326840

Title :   Development and Application of In-Situ, Real Time and Ex-Situ Characterization Techniques to Study the Growth of High Temperature Superconducting (HTSC) Films and Interfaces,

Corporate Author : NORTH CAROLINA UNIV AT CHAPEL HILL DEPT OF CHEMISTRY

Personal Author(s) : Irene, Eugene A. ; Auciello, O. ; Krauss, A. R. ; McGuire, G. E.

PDF Url : ADA326840

Report Date : 27 JUN 1997

Pagination or Media Count : 11

Abstract : The objectives of this program are: (1) To demonstrate Time of Flight Ion Scattering and Recoil (ToF-ISARS) Spectroscopy and Spectroscopic Ellipsometry (SE) for in-situ and real time characterization of HTSC thin films and processes. (2) To study HTSC thin film processes and interface reactions.

Descriptors :   *THIN FILMS, *HIGH TEMPERATURE SUPERCONDUCTORS, IONS, SCATTERING, REAL TIME, SPECTROSCOPY, INTERFACES, EPITAXIAL GROWTH, SURFACE REACTIONS, ELLIPSOMETERS.

Subject Categories : Physical Chemistry
      Atomic and Molecular Physics and Spectroscopy
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE