Accession Number : ADA332262
Title : Near-Field Scanning Optical Microscopy and Spectroscopy.
Descriptive Note : Final rept. 14 Apr 94-6 Jun 97,
Corporate Author : NORTH CAROLINA STATE UNIV AT RALEIGH DEPT OF PHYSICS
Personal Author(s) : Paesler, M. A. ; Yakobson, B. I.
PDF Url : ADA332262
Report Date : SEP 1997
Pagination or Media Count : 25
Abstract : The near-field scanning optical microscope, or NSOM, proyides spatial resolution of surface features considerably smaller than the wavelength of the radiation used to image. We have focused on both the development and the use of the NSOM. In the former, we considered the confinement of optical fields to nanometric structures. We analyzed the delivery of light from the far-field to the near-field region in tapered optical fibers. Our analysis led to the design and development of near-field probes of that allow for the performance of relatively light-starved NSOM experiments. Using such probes, we have demonstrated a capability of using spectral contrast in near-field imaging. In studies of KTP, for example, we have performed nano-Raman spectroscopy samples, and have imaged sub-wavelength surfaces features using only Raman-scattered light. In ongoing research we have launced further efforts to improve probe design and have begun nano-Raman investigations Mercury Cadmium Telluride and semiconducting diamond.
Descriptors : *OPTICAL ANALYSIS, *MICROSCOPES, *OPTICAL SCANNING, *NEAR FIELD, SPATIAL DISTRIBUTION, OPTICAL EQUIPMENT, OPTICAL PROPERTIES, PROBES, RADIATION, RESOLUTION, LIGHT, TRANSMISSION LINES, SEMICONDUCTORS, REGIONS, MICROSCOPY, SURFACES, SPECTRA, IMAGES, TAPER.
Subject Categories : Optical Detection and Detectors
Distribution Statement : APPROVED FOR PUBLIC RELEASE