Accession Number : ADA333415
Title : Design, construction and Programming of a Microcontroller-Based Testbench Suitable for Radiation Testing of Microelectronic Circuits
Descriptive Note : Master's thesis
Corporate Author : NAVAL POSTGRADUATE SCHOOL MONTEREY CA
Personal Author(s) : Thompson, John A.
PDF Url : ADA333415
Report Date : MAR 1997
Pagination or Media Count : 130
Abstract : This thesis describes the design, construction, and programming of a microcontroller- based testbench suitable for radiation testing microelectronic integrated circuits. It will be used to test circuits fabricated using the Low Temperature Gallium Arsenide (LT GaAs) fabrication process developed by the Naval Postgraduate School and the Naval Research Laboratory. The testbench will be used to test for sensitivity to Single Event Upsets (changes in logic level due to impact by high energy ions). Due to the spurious radiation around the particle accelerator, it will be remotely operated via a serial communication port. Radiation hardened components will eventually be used throughout, although for cost- savings, non-radiation hardened components are used in the initial design described here. The test bench is built around the Intel 8%C51 four-port microcontroller. As part of this research, it will be programmed to test two memory chips, one manufactured by Motorola Inc. and one by Vitesse Semiconductor Corporation. The Motorola chip requires that a special chip carrier with logic translation and output drivers be designed prior to testing.
Descriptors : *MICROELECTRONICS, *MICROCIRCUITS, MICROPROCESSORS, GALLIUM ARSENIDES, THESES, CHIPS(ELECTRONICS), SEMICONDUCTORS, MEMORY DEVICES, NAVAL RESEARCH LABORATORIES, RADIATION HARDENING, ELECTRICAL ENGINEERING.
Subject Categories : Electrical and Electronic Equipment
Electricity and Magnetism
Distribution Statement : APPROVED FOR PUBLIC RELEASE