Accession Number : ADA338675
Title : Damage Modes and Mechanisms of Si-Ge Films Under Prompt Soft X-Ray Radiation
Corporate Author : AEROSPACE CORP EL SEGUNDO CA MECHANICSAND MATERIALS TECHNOLOGY CENTER
Personal Author(s) : Gyetvay, Sandra R. ; Chang, Dick J. ; Muki, Rokuro
PDF Url : ADA338675
Report Date : 13 MAY 1992
Pagination or Media Count : 22
Abstract : Thermal and residual stresses in films exposed to sudden temperature changes are analyzed based on an elastoplastic brittle idealization of film response. The results thus obtained are used to explain qualitatively the damage mechanisms of various failure modes observed in Si-Ge film deposited on a single crystal Si substrate exposed to soft x-ray radiation for a short duration of time.
Descriptors : *SOFT X RAYS, *SILICON COATINGS, DAMAGE ASSESSMENT, THIN FILMS, SUBSTRATES, RESIDUAL STRESS, THERMAL STRESSES, RADIATION EFFECTS, ELASTOPLASTICITY, RADIATION DAMAGE.
Subject Categories : Coatings, Colorants and Finishes
Nuclear Physics & Elementary Particle Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE