Accession Number : ADA338838

Title :   High Resolution Studies of Thin Film Interfaces

Descriptive Note : Final rept. 1 May 90-1 Nov 95

Corporate Author : CORNELL UNIV ITHACA NY

Personal Author(s) : Buhrman, R. A.

PDF Url : ADA338838

Report Date : 02 MAR 1998

Pagination or Media Count : 11

Abstract : This research program was generally concerned with the application of Ballistic Electron Emission Microscopy (BEEM) and related scanning tunneling microscopy (STM) techniques to the study of interfacial ballistic transport in a range of electronic materials, and with the extension of BEEM to locally examine aspects, consequences, and possible applications of elastic and inelastic electronic scattering processes at both Schottky barrier interfaces and thin film overlayers.

Descriptors :   *INTERFACES, *THIN FILMS, *HIGH RESOLUTION, *ELECTRON MICROSCOPY, *ELECTRON EMISSION, ELECTRONICS, TUNNELING(ELECTRONICS), ELASTIC PROPERTIES, TRANSPORT, SCHOTTKY BARRIER DEVICES, INELASTIC SCATTERING.

Subject Categories : Electrical and Electronic Equipment
      Nuclear Physics & Elementary Particle Physics
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE