Accession Number : ADA338838
Title : High Resolution Studies of Thin Film Interfaces
Descriptive Note : Final rept. 1 May 90-1 Nov 95
Corporate Author : CORNELL UNIV ITHACA NY
Personal Author(s) : Buhrman, R. A.
PDF Url : ADA338838
Report Date : 02 MAR 1998
Pagination or Media Count : 11
Abstract : This research program was generally concerned with the application of Ballistic Electron Emission Microscopy (BEEM) and related scanning tunneling microscopy (STM) techniques to the study of interfacial ballistic transport in a range of electronic materials, and with the extension of BEEM to locally examine aspects, consequences, and possible applications of elastic and inelastic electronic scattering processes at both Schottky barrier interfaces and thin film overlayers.
Descriptors : *INTERFACES, *THIN FILMS, *HIGH RESOLUTION, *ELECTRON MICROSCOPY, *ELECTRON EMISSION, ELECTRONICS, TUNNELING(ELECTRONICS), ELASTIC PROPERTIES, TRANSPORT, SCHOTTKY BARRIER DEVICES, INELASTIC SCATTERING.
Subject Categories : Electrical and Electronic Equipment
Nuclear Physics & Elementary Particle Physics
Solid State Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE