Accession Number : ADB017548

Title :   Small Signal GaAs FET Problems

Descriptive Note : Semi-Annual rept. 5 Apr-5 Oct 1976

Corporate Author : AVANTEK INC SANTA CLARA CA

Personal Author(s) : Cooke, Harry F

PDF Url : ADB017548

Report Date : Mar 1977

Pagination or Media Count : 55

Abstract : GaAs FETs suffer from a number of problems which reduce performance and tend to keep the price high. In addition, there are a number of tasks related to GaAs FET to be accomplished such as a reliability evaluation and low temperature tests. The program has investigated a number of problems related to stability and performance and in addition, has made an evaluation of the potential reliability of FETs.

Descriptors :   *FIELD EFFECT TRANSISTORS, *GALLIUM ARSENIDES, COSTS, DRIFT, GATES(CIRCUITS), LOW TEMPERATURE, PERFORMANCE(ENGINEERING), RADIOFREQUENCY, RELIABILITY

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE