Accession Number : ADD000120
Title : Apparatus for Monitoring Thickness of Evaporated Film.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Davidson,James J
Report Date : 25 Dec 1973
Pagination or Media Count : 4
Abstract : The patent describes an apparatus for monitoring the thickness of a film as it is evaporated onto a substrate having a signal applicator for maintaining a voltage across the film. An oscilator is used to provide a constant voltage to the signal applicator and the resulting current through the film is measured across a series resistor by a differential amplifier. The output from the differential amplifier is connected to a detector and visual indicator.
Descriptors : *Monitors, *Patents, Thickness, Films, Metal films, Substrates, Vapor plating
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE