Accession Number : ADD000322

Title :   Ionization System for Sensing and Measuring Gaseous Impurities.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON D C

Personal Author(s) : Harris,William A ; Schluter,Bernard C ; Tromborg,Erik T

Report Date : 10 Sep 1974

Pagination or Media Count : 5

Abstract : This invention relates to detection of ions, and more particularly to a system for sensing and measuring gaseous impurities or vapors present in a carrier gas including air in low concentration. The sensor operates at atmospheric pressure and may be rendered selective in response to manipulation of sensor parameters. It also makes use of the ability of gases and vapors to be ionized by ionizing radiation, the ability of gaseous ions of opposite polarity to recombine into a neutral entity, and the ability of gaseous ions to be collected in the presence of an electrical field resulting in an electrical current. The present detector uses these phenomena in a different manner. Ionization occurs in a field free volume bounded in part by one electrode. Also, beta electrons do not expend all their energy in the gas. They hit the surface of one of the electrodes and cause secondary electrons to be emitted. In addition, electrode geometry and flow paths are arranged so as to promote recombination of ions prior to collection at the collector electrode.

Descriptors :   *Patents, *Gas detectors, Ions, Vapors, Gas ionization

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE