Accession Number : ADD000510

Title :   Electron Beam Ionization Signal Sampler.

Descriptive Note : Patent Application,


Personal Author(s) : Driusse,Conrad

Report Date : 12 Oct 1973

Pagination or Media Count : 9

Abstract : The patent application describes a signal sampler based on electron ionization principles, and having a cathode ray tube including an electron gun and deflection plates, and several semiconductor targets positioned near the face of the CRT. The input signal is applied to the grid of the tube and modulates the intensity of the electron beam emitted by the electron gun. The beam is systematically deflected for each pulse received by the system. The targets are illuminated by the beam and the current produced is proportional to the electron density. By this method, wherein the beam is systematically swept across the targets, and the input pulse is used to control the intensity of the beam, only one sweep is required to fully investigate the pulse. Investigation is accomplished by detecting and processing the current produced at each target.

Descriptors :   *Samplers, Patents, Signals, Pulses, Electron beams, Ionization, Cathode ray tubes

Subject Categories : Electrooptical and Optoelectronic Devices
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE