Accession Number : ADD001673

Title :   Integrated Circuit Test Clamp.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s) : Allard,Frank L

Report Date : 12 Aug 1975

Pagination or Media Count : 4

Abstract : The patent relates to a circuit testing clamp constructed for use with integrated circuits having two body members forming a clamping jaw operated by a spiral spring. A plurality of contact pads on opposing surfaces of the contact jaws are connectedd to leads which pass through the body and extend out the upper end to eyelets for easy attachment of test probes. To provide the maximum separation for attachment of test probes, alternate leads are brought out of the body of the clamp at 90 degree angles. The body of the clamp is composed of a hard heat resistant insulating material hinged together to maintain pressure at the contact area by the tension of the spiral spring.

Descriptors :   *Circuit testers, *Patents, Integrated circuits, Clamps

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE