Accession Number : ADD002403

Title :   Helix Pitch Monitor.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s) : Allard,Frederick C

Report Date : 09 Dec 1975

Pagination or Media Count : 4

Abstract : The patent relates to a method whereby the pitch of a helix is monitored by measurement of the reflection of a light source. Segments of a beam of light are reflected off of the helix, through a mask and onto a photodetector that receives light indicative of the proper spacing of the helix. The photodetector then supplies an output signal to a readout device that indicates if proper spacing of the helix being monitored is present.

Descriptors :   *Screw threads, *Quality control, *Lasers, *Patents, Helixes, Measurement, Measuring instruments

Subject Categories : Lasers and Masers
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE