Accession Number : ADD002403
Title : Helix Pitch Monitor.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Allard,Frederick C
Report Date : 09 Dec 1975
Pagination or Media Count : 4
Abstract : The patent relates to a method whereby the pitch of a helix is monitored by measurement of the reflection of a light source. Segments of a beam of light are reflected off of the helix, through a mask and onto a photodetector that receives light indicative of the proper spacing of the helix. The photodetector then supplies an output signal to a readout device that indicates if proper spacing of the helix being monitored is present.
Descriptors : *Screw threads, *Quality control, *Lasers, *Patents, Helixes, Measurement, Measuring instruments
Subject Categories : Lasers and Masers
Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE