Accession Number : ADD002516
Title : Subbottom Rock Mapping Probe.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Hironaka,Melvin C
Report Date : 02 Mar 1976
Pagination or Media Count : 5
Abstract : The patent relates to a subbottom rock mapping probe for measuring the thickness of a sediment layer located on the bottom of a body of water, comprises an automatic, downwardly extending, telescoping probe that is gimbally connected to a support member. Water is forced through the probe to disperse the sediment impeding the probe's downward extension. Recording equipment and related measuring devices measure and record the depth of penetration of the probe into the sediment layer from an initial or reference position.
Descriptors : *Ocean bottom, *Probes, *Patents, Underwater equipment, Ocean bottom soils, Mapping, Recording systems, Sediments, Thickness
Subject Categories : Physical and Dynamic Oceanography
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE