Accession Number : ADD003108
Title : Method of Determining Adequacy of Substrate Memory Wire during the Plating Process.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Seavey,Marden H , Jr ; Wyman,Joseph M ; Toledo,Emil
Report Date : 21 Sep 1976
Pagination or Media Count : 5
Abstract : The patent develops a number of magnetic and memory signatures for defining the adequacy of a coated substrate for memory wire applications. The signatures are determined from sets of films on substrates which characterize good wire and can be used to separate the marginally good from the marginally poor substrate by applying tests at selected steps in the processing of newly coated wire. Separate signatures are established by omitting steps or varying combinations of steps in conventional plating processes and then measuring the magnetic or memory properties from section to section or from bit to bit along the wire.
Descriptors : *Magnetic film memories, *Magnetic recording systems, *Patents, Plating, Metal films, Wire, Magnetic alloys, Copper, Copper alloys, Beryllium alloys, Surface roughness, Test methods, Quality control, Substrates, Signatures
Subject Categories : Recording and Playback Devices
Distribution Statement : APPROVED FOR PUBLIC RELEASE