Accession Number : ADD003204
Title : Electron Beam Ionization Signal Sampler.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Driussi,Conrad
Report Date : 13 Jul 1976
Pagination or Media Count : 4
Abstract : The patent relates to a signal sampler based on electron ionization principles, and having a cathode ray tube including an electron gun and deflection plates, and several semiconductor targets positioned near the face of the CRT. The input signal is applied to the grid of the tube and modulates the intensity of the electron beam emitted by the electron gun. The targets are illuminated by the beam and the current produced is proportional to the electron density. By this method, wherein the beam is swept across the targets, and the input pulse is used to control the intensity of the beam, only one sweep is required to fully investigate the pulse. Investigation is accomplished by detecting and processing the current produced at each target.
Descriptors : *Samplers, *Patents, Pulse analyzers, Electron beams, Ionization, Signals
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE