Accession Number : ADD003309
Title : Method and Apparatus for Pattern Analysis.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC
Personal Author(s) : Ginsburg, Arthur P
Report Date : 23 Nov 1976
Pagination or Media Count : 14
Abstract : The patent describes a technique and apparatus for two dimensional pattern analysis utilizing a transform of the pattern which enables the extraction of desired pattern information by means of spatial filtering in accordance with known human visual system processing. Two dimensional spatial frequencies resulting from the transform are acted on by either anisotropic or uniquely used conventional filters to extract one, two and three dimensional pattern information from spatial frequency subsets to determine general form, edge, texture and depth information for detection, identification and classification of objects in simple or complex scenes.
Descriptors : *PATTERN RECOGNITION, *PATENTS, IMAGE PROCESSING, SCENE ANALYSIS, VISUAL SIGNALS, FOURIER TRANSFORMATION
Subject Categories : Cybernetics
Distribution Statement : APPROVED FOR PUBLIC RELEASE