Accession Number : ADD003893
Title : Capacitance Transducer for the Measurement of Bending Strains at Elevated Temperatures.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Smith,Hugh H ; Michel,David J ; Shahinian,Paul
Report Date : 11 Jan 1977
Pagination or Media Count : 4
Abstract : A capacitance-type transducer used for the measurement of bending strains in test elements which are not sufficiently strong to support a strain element or for test elements in which a strain element would strengthen the test element and not give an accurate test is described. The transducer is formed by a spring wire which has a portion perpendicular to the test specimen with a U-shaped end extending from the perpendicular portion. One portion of the U-bend has an insulator about the wire where the insulator parallels the test specimen surface and is in contact therewith. The end of the wire has a flat conductive plate secured thereto with the flat plate parallel with the specimen. The spacing between the flat plate and the specimen forms the capacitance spacing which changes as the specimen is strained in a direction perpendicular to the flat plate. The distance between the flat plate and specimen is represented by a change in capacitance which is measured by an oscilloscope. The change in capacitance is used to calibrate the strain on the specimen.
Descriptors : *Patents, *Strain gages, *Transducers, *Capacitance, Bending, High temperature, Strain(Mechanics), Measurement, Detectors, Oscilloscopes
Subject Categories : Electrical and Electronic Equipment
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE