Accession Number : ADD003920

Title :   Retroreflectance Measurement System.

Descriptive Note : Patent Application,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s) : Derderian,George ; Breglia,Denis R

Report Date : 20 Apr 1977

Pagination or Media Count : 13

Abstract : A retroreflector evaluation system is disclosed as incorporating a laser and a plurality of laser light processing optical elements associated therewith in such manner as will permit the making of reflectance measurements at any or all points on the surface of retroreflective or other reflective samples or devices, thereby providing an indication of the intensity, uniformity, and other reflectance characteristics which determine the quality thereof. (Author)

Descriptors :   *Patent applications, *Retroreflectors, *Lasers, *Optical processing, Reflectance, Measurement, Optical instruments, Photodiodes

Subject Categories : Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE