Accession Number : ADD004035
Title : Determination of Thermal Impedances of Bonding Layers in Infrared Photoconductors.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C
Personal Author(s) : Bartoli,Filbert J ; Esterowitz,Leon ; Allen,Roger E ; Kruer,Melvin R
Report Date : 15 Mar 1977
Pagination or Media Count : 5
Abstract : The patent concerns a method of determining thermal constants of bonding layers of an infrared sensor which comprises cooling a bonded layer sensor to 77 K and then heating the sensor by a quick pulse of heat. The electrical resistance of the sensor is measured and the measurement continued to determine a thermal profile. The measured thermal profile is compared with a known profile to determine thickness of the bonding layers and the material layers.
Descriptors : *Patents, *Infrared detectors, *Bonded joints, *Heat transfer, Measurement, Photoconductors, Epoxy resins, Varnishes, Adhesives, Mercury compounds, Cadmium tellurides, Tellurides, Heat sinks, Thermal conductivity, Laser beams, Radiation effects
Subject Categories : Adhesives, Seals and Binders
Infrared Detection and Detectors
Distribution Statement : APPROVED FOR PUBLIC RELEASE