Accession Number : ADD004195

Title :   Probe Contact and Junction Detector.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON D C

Personal Author(s) : Kapfer,Vincent C

Report Date : 26 Jul 1977

Pagination or Media Count : 12

Abstract : The detection and indication of a probe contact to metalization and to junctions on chips during microcircuit analysis is achieved by means of a circuit comprising a complementary MOS transistor logic circuit and light emitting diodes (LEDs). A polarity switching circuit provides probe contact indication in response to '0' and '1' logic levels for both forward and reverse bias conditions. Other switching circuits provide sensitivity level selection and the transfer of probe output to an alternate microcircuit analysis device. An auxiliary sound indicator is connected in parallel with the visual LED indicators. Probe assembly capacitance is minimized by a plexiglass insulator that inserts a fixed capacitance between each probe contact. (Author)

Descriptors :   *Patents, *Probes, *Solid state electronics, *Integrated circuits, *Test equipment, Chips(Electronics), Complementary metal oxide semiconductors, Logic circuits, Metallizing, Semiconductor junctions, Light emitting diodes, Avalanche diodes, Selection, Switches, Polarity, Buffers

Subject Categories : Electrooptical and Optoelectronic Devices
      Test Facilities, Equipment and Methods
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE